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International Journal of Thin Film Science and Technology
An International Journal
               
 
 
 
 
 
 
 
 
 
 
 
 

Content
 

Vol. 8 > Jan. 2019

 

 

Studies by X-ray Absorption Spectrometry (XAS) of the Local Order at the Zironium Threshold in an α-AL2O3 Layer Developed by Oxidation at High Temperature on an Alloy FeCr22Al5, Vol. 8, No. 1 (Jan. 2019), PP:1-4

doi:10.18576/ijtfst/080101

for Subscribers only

Authors:
M. K. Loudjani - Paris-Saclay University, Institute of Molecular Chemistry and Materials of Orsay (ICMMO), UMR 8182 (CNRS), Synthesis Team, Properties and Modeling of Materials (SP2M), Bāt 410, Bur. 350, Rue du Doyen George Poitou 91405 Orsay Cedex - FRANCE.

How to Cite:
M. K. Loudjani, Studies by X-ray Absorption Spectrometry (XAS) of the Local Order at the Zironium Threshold in an α-AL2O3 Layer Developed by Oxidation at High Temperature on an Alloy FeCr22Al5, International Journal of Thin Film Science and Technology, Vol. 8, No. 1, pp: 1-4, 2019, Doi: https://dx.doi.org/10.18576/ijtfst/080101

 

Enhanced Light Trapping From Nanoparticle Arrays, Vol. 8, No. 1 (Jan. 2019), PP:5-8

doi:10.18576/ijtfst/080102

for Subscribers only

Authors:
Sukanya. R - Department of Electronics, Rathnavel Subramaniam College Of Arts & Science, COimbatore, India.
T. Sivakumar - Department of Electronics, Rathnavel Subramaniam College Of Arts & Science, COimbatore, India.

How to Cite:
Sukanya. R, T. Sivakumar, Enhanced Light Trapping From Nanoparticle Arrays, International Journal of Thin Film Science and Technology, Vol. 8, No. 1, pp: 5-8, 2019, Doi: https://dx.doi.org/10.18576/ijtfst/080102

 

Variation of Distribution of Concentration of Implanted Impurity with into Account Mismatch-Induced Stresses under Influence of Variation of Substrate Temperature, Vol. 8, No. 1 (Jan. 2019), PP:9-29

doi:10.18576/ijtfst/080103

for Subscribers only

Authors:
E. L. Pankratov - Nizhny Novgorod State University, 23 Gagarin avenue, Nizhny Novgorod, 603950, Russia.

How to Cite:
E. L. Pankratov, Variation of Distribution of Concentration of Implanted Impurity with into Account Mismatch-Induced Stresses under Influence of Variation of Substrate Temperature, International Journal of Thin Film Science and Technology, Vol. 8, No. 1, pp: 9-29, 2019, Doi: https://dx.doi.org/10.18576/ijtfst/080103

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