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05- International Journal of Thin Film Science and Technology
               
 
 
 
 
 
 
 
 
 
 
 
 

Forthcoming
 

 

Microstructures and Optical Properties of Nanocrystalline Pr-doped BaTiO3 Thin Film

Yofentina Iriani, A Suparmi, Ahmad Marzuki, Dianisa Khoirum Sandi,
Abstract :
This study aimed to synthesize Praseodymium (Pr) doped Barium Titanate (BT) or Ba1-xPrxTiO3 thin film and investigate the influence of Pr doping concentration on their microstructure and optical properties. The thin films with different Ba/Pr ratios (x=0, 0.03, 0.05, and 0.15) were fabricated on the quartz substrates using the sol-gel method with a spin coater. The microstructure and optical properties were observed by X-Ray Diffractometer (XRD) and UV-Vis Spectrophotometer, respectively. The microstructure results revealed that the lattice parameter, unit cell volume, and crystallite size of the Pr doped thin films decreased by the addition of Pr dopant. Meanwhile, the lattice strain and tetragonality were modified due to Pr doping. The optical measurement showed that the transmittance value advanced by giving Pr dopant, which caused the Pr-doped BT thin film to have higher refractive indices than the BT, thus making the Pr-doped samples possible to be anti-reflection coating. However, the bandgap is influenced by the thickness so that BT with the highest thickness possesses the highest bandgap, followed by Pr doping of 15%, 3%, and 5%.

 

Magnetization Behaviour of Nanocrystalline Permalloy Thin Films Prepared Using Oblique-Angle Magnetron Sputtering Technique

khalil gheisari, C.K. Ong, C.K. Ong,
Abstract :
In the current work, nanocrystalline Fe0.5Ni0.5 magnetic thin films were deposited on a Si(100) substrate using the oblique-angle sputtering technique with the oblique deposition angle ranging from 11.5 to 45. Structure, static magnetic properties, and dynamic magnetic characteristics were evaluated as a function of the deposition angle. The results indicate that the nanocrystalline FCC phase of FeNi with (111) preferred orientation and the average crystallite size of 6.3-9.3 nm was deposited successfully. The measured value of the uniaxial anisotropy field shows an increment from 7.65 to 16.71 Oe as the oblique angle rises from 11.5 to 45, which in turn leads to an increase in the ferromagnetic resonance frequency from 0.63 to 0.88 GHz.

 

Lead-free perovskite materials for solar cell: an update of recent trends

HO SOON MIN,
Abstract :
Researcher observed that the toxicity issue in lead based halide perovskite hindered large scale commercial applications in solar cell industries. At present, more new non-toxic or very low toxic perovskite materials were produced to achieve highly efficient and very stable solar cells. This review provides an update of recent works utilizing tin, germanium, caesium, copper, bismuth and antimony to replace lead perovskite materials for solar cells. The physical properties and power conversion efficiency of the solar cell were discussed in detail. The review finally highlighted challenges facing the successful development of lead-free perovskite solar cells. Research findings indicated low efficiency in Cu-based, Sb-based and Bi-based perovskites. While, the Sn-based and Ge-based perovskites faced the trouble of being easily decomposed by oxidation process.

 

Effect of KrF laser irradiation on the morphology and microstructure of amorphous PZT thin films grown by RF magnetron sputtering

mohammed mahdi,
Abstract :
This work deals with the crystallization of amorphous PZT thin films, induced by 248 nm KrF laser source. The as-grown 250 nm of PZT thin films using RF magnetron system, on tree different substrate (Si/SiO2/Ti/Pt, Si/SiO2, and glass/Al) are treated from 10 to 100 mj/cm. The morphology is investigated by scanning electron microscopy (SEM) and surface roughness by scanning probe microscopy (SPM). The microstructure using X-ray diffraction (XRD) and ellipsometry. The Si/SiO2/Ti/Pt/PZT samples morphology investigation shows the formation of square wells of 10 m side on the surface. However, the roughness measured is 11 nm. The microstructure analysis shows good crystallization following (110) dominant orientation with a grain size of 229.64 nm at 30, 25, and 20 mj/cm. For Si/SiO2/PZT samples, the surface morphology has seriously deteriorated. The microstructure analyses show the emerging of a weak peak of (110) plan with 110 nm of grain size, at 20 mj/cm however ablation starts at 25 mj/cm, at low energy 10 and 15 mj/cm only pyrochlore phase is observed. For glass/Al/PZT ablation occur at 15 mj/cm and microstructure analysis shows the amorphous phase at 10 mj/cm.

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