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Optimization of Deposition Parameters on the Physical Properties of TiO2 Thin Films by Spray Pyrolysis Technique, Vol. 3, No. 1 (Jan. 2014), PP:1-6
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Authors: |
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A. Gowri Manohari - Department of Physics, Annamalai University, Annamalai Nagar – 608 002, India
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S. Dhanapandian - Department of Physics, Annamalai University, Annamalai Nagar – 608 002, India
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K. Santhosh Kumar - Department of Physics, Annamalai University, Annamalai Nagar – 608 002, India
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T. Mahalingam - Department of Electrical and Computer Engineering, Ajou University, Suwon – 443 749, South Korea
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How to Cite:
A. Gowri Manohari, S. Dhanapandian, K. Santhosh Kumar, T. Mahalingam, Optimization of Deposition Parameters on the Physical Properties of TiO2 Thin Films by Spray Pyrolysis Technique, International Journal of Thin Film Science and Technology, Vol. 3, No. 1, pp: 1-6, 2014, Doi: https://dx.doi.org/10.18576//
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X-ray Diffraction Spectroscopy Studies of CuIn2n+1S3n+2 Thin Films, Vol. 3, No. 1 (Jan. 2014), PP:7-12
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Authors: |
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B. Khalfallah - Laboratoire de Photovolta¨ıque et Matriaux Semi-conducteurs - ENIT - Universit Tunis ElManar, BP 37, Le belv´ed`ere 1002-, Tunis
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N. Khemiri - Laboratoire de Photovolta¨ıque et Matriaux Semi-conducteurs - ENIT - Universit Tunis ElManar, BP 37, Le belv´ed`ere 1002-, Tunis
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D. Abdelkader - Laboratoire de Photovolta¨ıque et Matriaux Semi-conducteurs - ENIT - Universit Tunis ElManar, BP 37, Le belv´ed`ere 1002-, Tunis
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M. Kanzari - Laboratoire de Photovolta¨ıque et Matriaux Semi-conducteurs - ENIT - Universit Tunis ElManar, BP 37, Le belv´ed`ere 1002-, Tunis
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How to Cite:
B. Khalfallah, N. Khemiri, D. Abdelkader, M. Kanzari, X-ray Diffraction Spectroscopy Studies of CuIn2n+1S3n+2 Thin Films, International Journal of Thin Film Science and Technology, Vol. 3, No. 1, pp: 7-12, 2014, Doi: https://dx.doi.org/10.18576//
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Effect of thickness and annealing on structural and optical properties of Bi2Te3 thin films prepared from, Vol. 3, No. 1 (Jan. 2014), PP:13-18
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Authors: |
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S. M. Elahi - Plasma research center, Science and research Branch Islamic Azad University, Tehran, Iran
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A. Taghizadeh - Department of Physics, Faculty of Science, University of Razi, Kermanshah, Iran
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A. Hadizadeh - Department of Physics, Faculty of Science, University of Razi, Kermanshah, Iran
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L. Dejam - Plasma research center, Science and research Branch Islamic Azad University, Tehran, Iran
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How to Cite:
S. M. Elahi, A. Taghizadeh, A. Hadizadeh, L. Dejam, Effect of thickness and annealing on structural and optical properties of Bi2Te3 thin films prepared from, International Journal of Thin Film Science and Technology, Vol. 3, No. 1, pp: 13-18, 2014, Doi: https://dx.doi.org/10.18576//
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Study of Structural, Morphological and Optical Properties of Sb2S3 Thin Films Deposited by Oblique Angle Deposition, Vol. 3, No. 1 (Jan. 2014), PP:19-25
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Authors: |
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Chaffar Akkari Ferid - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-Universit´e de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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I. Trabelsi - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-Universit´e de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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A. Sinaoui - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-Universit´e de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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F. Aousgi - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-Universit´e de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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M. Kanzari - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-Universit´e de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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How to Cite:
Chaffar Akkari Ferid, I. Trabelsi, A. Sinaoui, F. Aousgi, M. Kanzari, Study of Structural, Morphological and Optical Properties of Sb2S3 Thin Films Deposited by Oblique Angle Deposition, International Journal of Thin Film Science and Technology, Vol. 3, No. 1, pp: 19-25, 2014, Doi: https://dx.doi.org/10.18576//
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The Effect of the Growth Condition on the Properties of the New Material Sn3Sb2S6 Thin Films, Vol. 3, No. 1 (Jan. 2014), PP:27-34
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Authors: |
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M. Kanzari - Laboratoire de Photovolta¨ıques et Mat´eriaux de Semi-conducteurs-ENIT-IPEITunis Montfleury-Universit´e de Tunis
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A. Larbi - Laboratoire de Photovolta¨ıques et Matriaux de Semi-conducteurs-ENIT-Universit de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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N. Khedmi - Laboratoire de Photovolta¨ıques et Matriaux de Semi-conducteurs-ENIT-Universit de Tunis el Manar, BP 37, le belv´ed`ere1002-Tunis, Tunisie
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How to Cite:
M. Kanzari, A. Larbi, N. Khedmi, The Effect of the Growth Condition on the Properties of the New Material Sn3Sb2S6 Thin Films, International Journal of Thin Film Science and Technology, Vol. 3, No. 1, pp: 27-34, 2014, Doi: https://dx.doi.org/10.18576//
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