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Effect of thickness and annealing on structural and optical properties of Bi2Te3 thin films prepared from |
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PP: 13-18 |
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Author(s) |
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S. M. Elahi,
A. Taghizadeh,
A. Hadizadeh,
L. Dejam,
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Abstract |
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| Thin films Bi2Te3 with the thickness range of 37-110 nm have been deposited on clean glass substrates by the thermally
evaporated technique in a vacuum of 1 10 -5 Torr. The influence of thickness and annealing on the structural and optical properties has
been studied. The XRD patterns showed after thermal annealing the Bi2Te3 thin films became polycrystalline in structure. The lattice
parameters of the samples were calculated and the structural parameters were discussed on the basis of annealing effect. The AFM
images revealed a homogeneous Bi2Te3 dispersion within the layer in higher annealing temperature. Absorption spectra indicate that
films were having considerable absorption throughout visible region. Optical band gap energy decreased with increasing film thickness
and annealing temperature. |
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