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05- International Journal of Thin Film Science and Technology
An International Journal


Volumes > Vol. 11 > No. 3


Interface Resistivity in Ni/Cu Bilayers, and Ni/Pd bilayers Comparison of the Mode of Electrical Transport in Ni/Cu bilayers and Ni/Pd bilayers in Relation with the Chemical Reactions at the Interfaces of bilayers

PP: 321-326
M. K. Loudjani,
In this study we determined and compared interphases-interfaces-resistivity between nickel/copper bilayers and nickel/palladium bilayers in relation to the chemical reactions which can take place at the interfaces of bilayers and deduced the electric transport mode in bilayers.

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