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International Journal of Thin Films Science and Technology
An International Journal
               
 
 
 
 
 
 
 
 
 
 

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Volumes > Vol. 7 > No. 2

 
   

Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films.

PP: 67-71
doi:10.18576/ijtfst/070203
Author(s)
M. K. Loudjani, C. Sella,
Abstract
In this study we compared resistivity measurements I and film thicknesses obtained on bi layers Ni/Cu films and tri layers Ni/Pd/Cu films with the values of resistivities and thicknesses calculated according to the model of Schumann and Gardner applied to a multi-layera system. The experimental and calculated values agree within a few %.

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