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04- International Journal of Thin Films Science and Technology
An International Journal
               
 
 
 
 
 
 
 
 
 
 
 

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Volumes > Vol. 7 > No. 2

 

 

Steady State Creep Characteristics of Sn96.5Ag3.5 Based Alloys, Vol. 7, No. 2 (May 2018), PP:49-59

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Authors:
M. Y. Salem - Physics Department, Faculty of Science at New Valley, Assuit University, 72511, El-Kharga, Egypt.

 

Influence of Deposition Parameters on Optical Properties of Sputtered Tungsten Oxide Films, Vol. 7, No. 2 (May 2018), PP:61-65

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Authors:
Christopher Mkirema Maghanga - Department of Biological & Physical Sciences, Kabarak University, P.O. Private Bag -20157 Kabarak, Kenya.

 

Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films., Vol. 7, No. 2 (May 2018), PP:67-71

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Authors:
M. K. Loudjani - Université Paris-Saclay, Institut de Chimie Moléculaire et des Matériaux dOrsay (ICMMO), UMR 8182 (CNRS), Equipe Synthèse, Propriétés et Modélisation des Matériaux (SP2M), Bât 410, Bur. 350, Rue du Doyen Georges Poitou 91405 Orsay Cedex, France.
C. Sella - Institut des Nano-Sciences de Paris, Université de Paris-VI, campus Boucicaut, 140 rue de Lourmel 75015 Paris, France.

 

On Optimization of Manufacturing of A High-Voltage Current Driver Based on Hetero Structures to Increase Density of Their Elements. Influence of Miss-Match Induced Stress and Porosity of Materials on Technological Process, Vol. 7, No. 2 (May 2018), PP:73-94

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Authors:
E. L. Pankratov - Nizhny Novgorod State University, 23 Gagarin avenue, Nizhny Novgorod, 603950, Russia.

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