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Dose-Response Characterization Of (ZnO)0.2(TeO2)0.8 Thin Films for High-Dose X-Ray Applications |
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PP: 269-274 |
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doi:10.18576/jrna/100308
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Author(s) |
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Idris M. Mustapha,
Suleiman Babani,
Akpanowo Mbet,
Ubong Effiong,
Ubong Effiong,
Atef El-Taher,
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Abstract |
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| This study explores the structural properties and X-ray dosimetric performance of (ZnO)₀.₂(TeO₂)₀.₈ thin films fabricated using the spray pyrolysis method. Aqueous solutions containing zinc acetate dihydrate and tellurium dioxide were deposited onto glass substrates to form both pure and doped ZnO-TeO₂ thin films. Interdigitated graphite electrodes were applied to the films to serve as electrical contacts. Current-voltage (I-V) measurements were conducted under X-ray irradiation from a linear accelerator (Linac). At all applied voltages, the measured current increased linearly with increasing X-ray dose.. The thin films demonstrated sensitivity values ranging from 0.37 to 0.94 mA/cm²/Gy, corresponding to minimum detectable doses between 1.064 and 2.703 mGy. The linear regression analysis of the I-V characteristics produced correlation coefficients ranging from 0.966 to 0.998, with regression errors between 0.0006 and 0.0025. These findings suggest that (ZnO)₀.₂(TeO₂)₀.₈ thin films are promising candidates for high-dose X-ray detection, particularly in clinical radiotherapy using Linac systems. |
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