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Multiply Censored Partially Accelerated Life Testing for Power Function Model |
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PP: 147-152 |
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doi:10.18576/amis/150206
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Author(s) |
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Showkat Ahmad Lone,
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Abstract |
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| The present paper explores estimating failure time data under step-stress partially accelerated life testing based on multiply censored data. The lifetime distribution of the test units is assumed to follow the Power Function distribution. The point and interval maximum-likelihood estimations are obtained for the distribution parameter and tampering coefficient. The performances of the estimators of the model parameters using multiply censored data are evaluated and compared in terms of biases and root mean squared errors using a Monte Carlo simulation study.
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