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X-ray Diffraction Spectroscopy Studies of CuIn2n+1S3n+2 Thin Films |
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PP: 7-12 |
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Author(s) |
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B. Khalfallah,
N. Khemiri,
D. Abdelkader,
M. Kanzari,
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Abstract |
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| CuIn2n+1S3n+2 (where n = 0, 1, 2, 3 and 5) thin films were deposited at different substrate temperatures (30, 75, 100, 150
and 200 ◦C) by vacuum evaporation. The films were characterized for their structural properties by using X-ray diffraction (XRD).
From the XRD data, we calculated the grain size, the lattice strain, the lattice parameters and the dislocation density for the preferential
orientation of CuIn2n+1S3n+2 thin films. The effect of the substrate temperature on the structural crystalline quality of the films was
also investigated. |
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