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International Journal of Thin Films Science and Technology
An International Journal
               
 
 
 
 
 
 
 
 
 
 

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Volumes > Vol. 5 > No. 3

 
   

Choice of a Substrate for PdxNi1-x Thin Films used as Hydrogen Sensors

PP: 169-171
doi:10.18576/ijtfst/050304
Author(s)
M. K. Loudjani,
Abstract
In this work we studied the effect of the order at the interface of a Pd20Ni80 thin film deposited on different substrates on the electric resistance (R) thin film. We analyzed the fluctuations of the electric resistance (R) of Pd20Ni80 thin film after 1000 measurements. The relative error of the electric resistance (R/R) of a Pd20Ni80 thin film is minimal when the surface of the substrate is ordered, obtained with an -alumina single crystal substrate, while this ratio presents a strong drift in the absence of order at the interface when the substrate used is an amorphous silica glass. After 1000 measurements at strong current (I = 50 mA), the mean relative error of the electric resistance of the Ni80Pd20 films deposited on an -alumina single crystal is 33 times weaker than the relative error of the electric resistance obtained for the same film deposited on silica glass.

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