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Advanced Engineering Technology and Application
An International Journal
               
 
 
 
 
 

Content
 

Vol. 2 > Jan. 2013

 

 

A Modern Precise Full-Wave Rectifier in CMOS Technology for Various Applications, Vol. 2, No. 1 (Jan. 2013), PP:1-4

for Subscribers only

Authors:
Aref Vakili - Sadjad Institute for Higher Education, Mashhad, Iran
Mohsen Sadeghi - Sadjad Institute for Higher Education, Mashhad, Iran
Abbas Golmakani - Sadjad Institute for Higher Education, Mashhad, Iran

How to Cite:
Aref Vakili, Mohsen Sadeghi, Abbas Golmakani, A Modern Precise Full-Wave Rectifier in CMOS Technology for Various Applications, Advanced Engineering Technology and Application, Vol. 2, No. 1, pp: 1-4, 2013, Doi: https://dx.doi.org/10.18576//

 

Extension in The Case of Arrays in Daikon like Tools, Vol. 2, No. 1 (Jan. 2013), PP:5-10

for Subscribers only

Authors:
M. H. Fouladgar - School of Computer Engineering, Iran University of Science and Technology (IUST), Tehran, Iran
B. Minaei-Bidgoli - School of Computer Engineering, Iran University of Science and Technology (IUST), Tehran, Iran
H. Parvin - Department of Computer Engineering, Nourabad Branch, Islamic Azad University, Nourabad, Iran
H. Alinejad-Rokny - Complex Systems in Biology Group, Centre for Vascular Research, Faculty of Medicine, The University of New South Wales, Sydney, NSW, Australia

How to Cite:
M. H. Fouladgar, B. Minaei-Bidgoli, H. Parvin, H. Alinejad-Rokny, Extension in The Case of Arrays in Daikon like Tools, Advanced Engineering Technology and Application, Vol. 2, No. 1, pp: 5-10, 2013, Doi: https://dx.doi.org/10.18576//

 

Ontology Algorithm Using Two Classes of Regressions, Vol. 2, No. 1 (Jan. 2013), PP:11-14

for Subscribers only

Authors:
Yun Gao - Department of Editorial, Yunnan Normal University,Kunming, Yunnan 650092 China.
Wei Gao - School of Information and technology, Yunnan Normal University, Kunming, Yunnan 650500, China

How to Cite:
Yun Gao, Wei Gao, Ontology Algorithm Using Two Classes of Regressions, Advanced Engineering Technology and Application, Vol. 2, No. 1, pp: 11-14, 2013, Doi: https://dx.doi.org/10.18576//

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